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[IEEE Design, Automation and Test in Europe - Munich, Germany (07-11 March 2005)] Design, Automation and Test in Europe - A Complete Network-On-Chip Emulation Framework

contributor authorGenko, N.
contributor authorAtienza, D.
contributor authorDe Micheli, G.
contributor authorMendias, J.M.
contributor authorHermida, R.
contributor authorCatthoor, F.
date accessioned2020-03-13T18:23:39Z
date available2020-03-13T18:23:39Z
date issued2005
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1393082?show=full
formatgeneral
languageEnglish
title[IEEE Design, Automation and Test in Europe - Munich, Germany (07-11 March 2005)] Design, Automation and Test in Europe - A Complete Network-On-Chip Emulation Framework
typeJournal Paper
contenttypeMetadata Only
identifier padid10312436
identifier doi10.1109/DATE.2005.5
coverageAcademic
pages246-251
filesize248227
citations0


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