Radiation-Induced Soft Error Analysis of STT-MRAM: A Device to Circuit Approach
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, , , , , ,سال
: 2015شناسه الکترونیک: 10.1109/TCAD.2015.2474366
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Radiation-Induced Soft Error Analysis of STT-MRAM: A Device to Circuit Approach
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| contributor author | Jianlei Yang | |
| contributor author | Peiyuan Wang | |
| contributor author | Yaojun Zhang | |
| contributor author | Yuanqing Cheng | |
| contributor author | Weisheng Zhao | |
| contributor author | Yiran Chen | |
| contributor author | Hai Li | |
| date accessioned | 2020-03-13T05:05:48Z | |
| date available | 2020-03-13T05:05:48Z | |
| date issued | 2015 | |
| identifier other | uOc_QC8BUXfjmepzkioO3RqeX2AE2D1EmVcWqnnUAgPD0SMCPk.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1213422 | |
| format | general | |
| language | English | |
| title | Radiation-Induced Soft Error Analysis of STT-MRAM: A Device to Circuit Approach | |
| type | Journal Paper | |
| contenttype | Fulltext | |
| contenttype | Fulltext | |
| identifier padid | 8798383 | |
| identifier doi | 10.1109/TCAD.2015.2474366 | |
| journal title | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems | |
| coverage | Academic | |
| pages | 1-1 | |
| filesize | 4094781 | |
| citations | 1 |