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contributor authorWang Kang
contributor authorLiuyang Zhang
contributor authorJacques-Olivier Klein
contributor authorYouguang Zhang
contributor authorDafine Ravelosona
contributor authorWeisheng Zhao
date accessioned2020-03-13T05:05:43Z
date available2020-03-13T05:05:43Z
date issued2015
identifier otherHrT7NLU3pS3lIaDmL8UgRJ76oL9vU6BTWVOc5nSlIp6CsT1OZT.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1213404?locale-attribute=fa&show=full
formatgeneral
languageEnglish
titleReconfigurable Codesign of STT-MRAM Under Process Variations in Deeply Scaled Technology
typeJournal Paper
contenttypeFulltext
contenttypeFulltext
identifier padid8798332
identifier doi10.1109/TED.2015.2412960
journal titleIEEE Transactions on Electron Devices
coverageAcademic
pages1769-1777
journal volume62
journal issue6
filesize3264724
citations1


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