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Simultaneous process self-calibration method using TDC for 3D DDR4 DRAM

Author:
Reum Oh
,
Jang, Jin
,
Kim, Jung-Ho
,
Man Young Sung
Publisher:
IET
Year
: 2014
DOI: 10.1049/el.2014.1595
URI: https://libsearch.um.ac.ir:443/fum/handle/fum/1147458
Keyword(s): DRAM chips,integrated circuit design,low-power electronics,three-dimensional integrated circuits,time-digital conversion,3D DDR4 DRAM,3D double data rate 4 DRAM,TDC,TSV,high density memory,low power electronics,self-calibration method,slowest signal detection,three dimensional dynamic random access memory,time-to-digital converter,voltage 1.2 V
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    Simultaneous process self-calibration method using TDC for 3D DDR4 DRAM

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contributor authorReum Oh
contributor authorJang, Jin
contributor authorKim, Jung-Ho
contributor authorMan Young Sung
date accessioned2020-03-13T00:27:27Z
date available2020-03-13T00:27:27Z
date issued2014
identifier issn0013-5194
identifier other6937288.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1147458
formatgeneral
languageEnglish
publisherIET
titleSimultaneous process self-calibration method using TDC for 3D DDR4 DRAM
typeJournal Paper
contenttypeMetadata Only
identifier padid8330417
subject keywordsDRAM chips
subject keywordsintegrated circuit design
subject keywordslow-power electronics
subject keywordsthree-dimensional integrated circuits
subject keywordstime-digital conversion
subject keywords3D DDR4 DRAM
subject keywords3D double data rate 4 DRAM
subject keywordsTDC
subject keywordsTSV
subject keywordshigh density memory
subject keywordslow power electronics
subject keywordsself-calibration method
subject keywordsslowest signal detection
subject keywordsthree dimensional dynamic random access memory
subject keywordstime-to-digital converter
subject keywordsvoltage 1.2 V
identifier doi10.1049/el.2014.1595
journal titleElectronics Letters
journal volume50
journal issue22
filesize302103
citations1
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