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64 x 48 TOF sensor in 0.35 spl mu/m CMOS with high ambient light immunity

Author:
Davidovic, M.
,
Seiter, J.
,
Hofbauer, Michael
,
Gaberl, Wolfgang
,
Schidl, Stefan
,
Zimmermann, Horst
Publisher:
IET
Year
: 2014
DOI: 10.1049/el.2014.2272
URI: https://libsearch.um.ac.ir:443/fum/handle/fum/1144322
Keyword(s): CMOS image sensors,1P4M CMOS process,fill factor,high ambient light immunity,high immunity against ambient light,multipixel 64&,#x00D7,48 time-of-flight range sensor,multipixel TOF sensor,multipixel array,size 0.35 mum
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    64 x 48 TOF sensor in 0.35 spl mu/m CMOS with high ambient light immunity

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contributor authorDavidovic, M.
contributor authorSeiter, J.
contributor authorHofbauer, Michael
contributor authorGaberl, Wolfgang
contributor authorSchidl, Stefan
contributor authorZimmermann, Horst
date accessioned2020-03-13T00:22:27Z
date available2020-03-13T00:22:27Z
date issued2014
identifier issn0013-5194
identifier other6898655.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1144322?locale-attribute=en
formatgeneral
languageEnglish
publisherIET
title64 x 48 TOF sensor in 0.35 spl mu/m CMOS with high ambient light immunity
typeJournal Paper
contenttypeMetadata Only
identifier padid8326995
subject keywordsCMOS image sensors
subject keywords1P4M CMOS process
subject keywordsfill factor
subject keywordshigh ambient light immunity
subject keywordshigh immunity against ambient light
subject keywordsmultipixel 64&
subject keywords#x00D7
subject keywords48 time-of-flight range sensor
subject keywordsmultipixel TOF sensor
subject keywordsmultipixel array
subject keywordssize 0.35 mum
identifier doi10.1049/el.2014.2272
journal titleElectronics Letters
journal volume50
journal issue19
filesize424777
citations0
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