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contributor authorSun, Wen
contributor authorZheng, Xiaoquan
contributor authorCampbell, Joe C.
date accessioned2020-03-13T00:18:50Z
date available2020-03-13T00:18:50Z
date issued2014
identifier issn1041-1135
identifier other6879478.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1142113?show=full
formatgeneral
languageEnglish
publisherIEEE
titleStudy of Excess Noise Factor Under Nonlocal Effect in Avalanche Photodiodes
typeJournal Paper
contenttypeMetadata Only
identifier padid8324603
subject keywordsAvalanche photodiodes
subject keywordsImpact ionization
subject keywordsMonte Carlo methods
subject keywordsNoise
subject keywordsAvalanche photodiode
subject keywordsMonte Carlo simulation
subject keywordsexcess noise factor
subject keywordsimpact ionization
identifier doi10.1109/LPT.2014.2348914
journal titlePhotonics Technology Letters, IEEE
journal volume26
journal issue21
filesize778619
citations0


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