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contributor authorAmbrogio, Stefano
contributor authorBalatti, S.
contributor authorCubeta, A.
contributor authorCalderoni, Alessandro
contributor authorRamaswamy, Nirmal
contributor authorIelmini, Daniele
date accessioned2020-03-13T00:11:49Z
date available2020-03-13T00:11:49Z
date issued2014
identifier issn0018-9383
identifier other6847142.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1137855?locale-attribute=en&show=full
formatgeneral
languageEnglish
publisherIEEE
titleStatistical Fluctuations in HfO<sub><italic><bold>x</bold></italic></sub> Resistive-Switching Memory: Part II&#x2014;Random Telegraph Noise
typeJournal Paper
contenttypeMetadata Only
identifier padid8319831
subject keywordsPoole-Frenkel effect
subject keywordsintegrated circuit noise
subject keywordsrandom noise
subject keywordsrandom-access storage
subject keywordsHfO<
subject keywordssub>
subject keywordsx<
subject keywords/sub>
subject keywordsJoule heating
subject keywordsPoole-Frenkel barrier modifications
subject keywordsRRAM
subject keywordsconductive filament
subject keywordslocalized current path
subject keywordsrandom telegraph noise
subject keywordsread noise
subject keywordsresistive switching memory
subject keywordsresistive switching random access memory
subject keywordsstatistical fluctuations
subject keywordsCurrent measurement
subject keywordsDoping
subject keywordsNoise
subject keywordsResistance
subject keywordsSwitches
subject keywordsTime measurement
subject keywordsVoltage measurement
subject keywordsNoise fluctuations
subject keywordsrandom telegraph noise (RTN)
subject keywordsresi
identifier doi10.1109/TED.2014.2330202
journal titleElectron Devices, IEEE Transactions on
journal volume61
journal issue8
filesize3296916
citations0


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