Insulation Resistance and Leakage Currents in Low-Voltage Ceramic Capacitors With Cracks
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: 2014شناسه الکترونیک: 10.1109/TCPMT.2014.2318178
کلیدواژه(گان): ceramic capacitors,cracks,leakage currents,absorption currents,activation energy,cracks,electron volt energy 0.6 eV to 1.1 eV,insulation resistance measurement,intrinsic leakage currents,mechanical defects,multilayer ceramic capacitors,room temperature,Absorption,Capacitance,Capacitors,Current measurement,Leakage currents,Temperature measurement,Voltage measurement,Ceramic capacitors,crack detection,dielectric polarization,insulation testing,leakage current,testing,testi
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Insulation Resistance and Leakage Currents in Low-Voltage Ceramic Capacitors With Cracks
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contributor author | Teverovsky, Alexander | |
date accessioned | 2020-03-13T00:03:59Z | |
date available | 2020-03-13T00:03:59Z | |
date issued | 2014 | |
identifier issn | 2156-3950 | |
identifier other | 6817589.pdf | |
identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1133147 | |
format | general | |
language | English | |
publisher | IEEE | |
title | Insulation Resistance and Leakage Currents in Low-Voltage Ceramic Capacitors With Cracks | |
type | Journal Paper | |
contenttype | Metadata Only | |
identifier padid | 8314268 | |
subject keywords | ceramic capacitors | |
subject keywords | cracks | |
subject keywords | leakage currents | |
subject keywords | absorption currents | |
subject keywords | activation energy | |
subject keywords | cracks | |
subject keywords | electron volt energy 0.6 eV to 1.1 eV | |
subject keywords | insulation resistance measurement | |
subject keywords | intrinsic leakage currents | |
subject keywords | mechanical defects | |
subject keywords | multilayer ceramic capacitors | |
subject keywords | room temperature | |
subject keywords | Absorption | |
subject keywords | Capacitance | |
subject keywords | Capacitors | |
subject keywords | Current measurement | |
subject keywords | Leakage currents | |
subject keywords | Temperature measurement | |
subject keywords | Voltage measurement | |
subject keywords | Ceramic capacitors | |
subject keywords | crack detection | |
subject keywords | dielectric polarization | |
subject keywords | insulation testing | |
subject keywords | leakage current | |
subject keywords | testing | |
subject keywords | testi | |
identifier doi | 10.1109/TCPMT.2014.2318178 | |
journal title | Components, Packaging and Manufacturing Technology, IEEE Transactions on | |
journal volume | 4 | |
journal issue | 7 | |
filesize | 2170997 | |
citations | 0 |