Development of a Life Model for Light Emitting Diodes Stressed by Forward Current
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سال
: 2014شناسه الکترونیک: 10.1109/TR.2014.2315926
کلیدواژه(گان): electric current,life testing,light emitting diodes,LED,constant stress,cumulative damage theory,forward current,life model,light emitting diodes,load cycles,time-to-failure,Aging,Current measurement,Light emitting diodes,Predictive models,Stress,Switches,Temperature measurement,Life models,Miner',s Law,accelerated life tests,forward current,light emitting diodes,mean time to failure
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Development of a Life Model for Light Emitting Diodes Stressed by Forward Current
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| contributor author | Albertini, Andrea | |
| contributor author | Mazzanti, G. | |
| contributor author | Peretto, Lorenzo | |
| contributor author | Tinarelli, Roberto | |
| date accessioned | 2020-03-13T00:00:33Z | |
| date available | 2020-03-13T00:00:33Z | |
| date issued | 2014 | |
| identifier issn | 0018-9529 | |
| identifier other | 6807523.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1131160 | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Development of a Life Model for Light Emitting Diodes Stressed by Forward Current | |
| type | Journal Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8311884 | |
| subject keywords | electric current | |
| subject keywords | life testing | |
| subject keywords | light emitting diodes | |
| subject keywords | LED | |
| subject keywords | constant stress | |
| subject keywords | cumulative damage theory | |
| subject keywords | forward current | |
| subject keywords | life model | |
| subject keywords | light emitting diodes | |
| subject keywords | load cycles | |
| subject keywords | time-to-failure | |
| subject keywords | Aging | |
| subject keywords | Current measurement | |
| subject keywords | Light emitting diodes | |
| subject keywords | Predictive models | |
| subject keywords | Stress | |
| subject keywords | Switches | |
| subject keywords | Temperature measurement | |
| subject keywords | Life models | |
| subject keywords | Miner' | |
| subject keywords | s Law | |
| subject keywords | accelerated life tests | |
| subject keywords | forward current | |
| subject keywords | light emitting diodes | |
| subject keywords | mean time to failure | |
| identifier doi | 10.1109/TR.2014.2315926 | |
| journal title | Reliability, IEEE Transactions on | |
| journal volume | 63 | |
| journal issue | 2 | |
| filesize | 1376038 | |
| citations | 1 |