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Recovery of Electrical Characteristics of Au/n-Si Schottky Junction Under <inline-formula> <img src="/images/tex/21647.gif" alt="{}^{60}\\hbox {Co}"> </inline-formula> Gamma Irradiation

contributor authorVerma, Shalini
contributor authorPraveen, Kumsi C.
contributor authorBobby, Achamma
contributor authorKanjilal, D.
date accessioned2020-03-12T23:53:38Z
date available2020-03-12T23:53:38Z
date issued2014
identifier issn1530-4388
identifier other6776434.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1127121?show=full
formatgeneral
languageEnglish
publisherIEEE
titleRecovery of Electrical Characteristics of Au/n-Si Schottky Junction Under <inline-formula> <img src="/images/tex/21647.gif" alt="{}^{60}\\hbox {Co}"> </inline-formula> Gamma Irradiation
typeJournal Paper
contenttypeMetadata Only
identifier padid8307048
subject keywordsSchottky barriers
subject keywordscapacitance measurement
subject keywordscobalt
subject keywordselectric current measurement
subject keywordselectron transport theory
subject keywordselemental semiconductors
subject keywordsgamma-rays
subject keywordsgold
subject keywordsrecovery
subject keywordssemiconductor junctions
subject keywordssilicon
subject keywordsvoltage measurement
subject keywords60Co gamma rays
subject keywords<
subject keywordssup>
subject keywords60<
subject keywords/sup>
subject keywordsCo
subject keywordsAu-Si
subject keywordsAu-n-Si metal-semiconductor Schottky barrier junction
subject keywordsC-V measurements
subject keywordsI-V measurements
subject keywordsSchottky interface
subject keywordsannealing
subject keywordscapacitance-voltage measurements
subject keywordscurrent-voltage measurements
subject keywordselectrical transport characteristics
subject keywordselect
identifier doi10.1109/TDMR.2014.2312753
journal titleDevice and Materials Reliability, IEEE Transactions on
journal volume14
journal issue2
filesize525113
citations0


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