Improved Performance of 365-nm LEDs by Inserting an Un-Doped Electron-Blocking Layer
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Year
: 2014DOI: 10.1109/LED.2014.2306711
Keyword(s): aluminium compounds,current density,electroluminescence,leakage currents,light emitting diodes,photoluminescence,reliability,Al<,sub>,0.23<,/sub>,Ga<,sub>,0.77<,/sub>,N,EBL,EL,UV-LED,aging test,electroluminescence characteristics,leakage current density,long-term reliability,photoluminescence characteristics,size 365 nm,size 375 nm,time 1032 h,ultraviolet light emitting diode,undoped electron-blocking layer,Aluminum gallium nitride,Current density,Gallium n
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Improved Performance of 365-nm LEDs by Inserting an Un-Doped Electron-Blocking Layer
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| contributor author | Wen-Yu Lin | |
| contributor author | Tzu-Yu Wang | |
| contributor author | Sin-Liang Ou | |
| contributor author | Jia-Hao Liang | |
| contributor author | Dong-Sing Wuu | |
| date accessioned | 2020-03-12T23:50:45Z | |
| date available | 2020-03-12T23:50:45Z | |
| date issued | 2014 | |
| identifier issn | 0741-3106 | |
| identifier other | 6758367.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1125423 | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Improved Performance of 365-nm LEDs by Inserting an Un-Doped Electron-Blocking Layer | |
| type | Journal Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8305071 | |
| subject keywords | aluminium compounds | |
| subject keywords | current density | |
| subject keywords | electroluminescence | |
| subject keywords | leakage currents | |
| subject keywords | light emitting diodes | |
| subject keywords | photoluminescence | |
| subject keywords | reliability | |
| subject keywords | Al< | |
| subject keywords | sub> | |
| subject keywords | 0.23< | |
| subject keywords | /sub> | |
| subject keywords | Ga< | |
| subject keywords | sub> | |
| subject keywords | 0.77< | |
| subject keywords | /sub> | |
| subject keywords | N | |
| subject keywords | EBL | |
| subject keywords | EL | |
| subject keywords | UV-LED | |
| subject keywords | aging test | |
| subject keywords | electroluminescence characteristics | |
| subject keywords | leakage current density | |
| subject keywords | long-term reliability | |
| subject keywords | photoluminescence characteristics | |
| subject keywords | size 365 nm | |
| subject keywords | size 375 nm | |
| subject keywords | time 1032 h | |
| subject keywords | ultraviolet light emitting diode | |
| subject keywords | undoped electron-blocking layer | |
| subject keywords | Aluminum gallium nitride | |
| subject keywords | Current density | |
| subject keywords | Gallium n | |
| identifier doi | 10.1109/LED.2014.2306711 | |
| journal title | Electron Device Letters, IEEE | |
| journal volume | 35 | |
| journal issue | 4 | |
| filesize | 590437 | |
| citations | 0 |