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contributor authorSalgado Fereira, A. , Barbin, S.E. , Kretly, L.C.
date accessioned2020-03-12T23:34:39Z
date available2020-03-12T23:34:39Z
date issued2014
identifier other6899976.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1116651?show=full
formatgeneral
languageEnglish
publisherIEEE
titleAntenna signature: A qualitative analysis of planar antennas by electromagnetic scanning using TDR-Time Domain Reflectometry
typeConference Paper
contenttypeMetadata Only
identifier padid8286299
subject keywordscadmium compounds
subject keywordscopper
subject keywordssilver
subject keywordssolar cells
subject keywordsthin film devices
subject keywordsCdTe:Ag
subject keywordsCdTe:Cu
subject keywordsbarrier height measurement
subject keywordscompensation
subject keywordsdonor type defect
subject keywordselemental distribution
subject keywordshole density measurement
subject keywordslow acceptor dopant concentration
subject keywordsopen circuit voltage
subject keywordspolycrystalline layer
subject keywordssolar cell
subject keywordsspace charge measurement
subject keywordsthin film
subject keywordsConductivity
subject keywordsCurrent measurement
subject keywordsDensity measurement
subject keywordsDoping
subject keywordsPhotovoltaic cells
subject keywordsSubstrates
subject keywordsTemperature measurement
subject keywordsCadmium compounds
subject keywordsSemiconductor device doping
subject keywordsSilver
identifier doi10.1109/PVSC.2014.6925689
journal titleicrowaves, Radar, and Wireless Communication (MIKON), 2014 20th International Conference on
filesize2060397
citations1


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