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Proximity effects between striplines and vias

contributor authorKwark, Y.H.
contributor authorRimolo-Donadio, R.
contributor authorBaks, C.W.
contributor authorMuller, S.
contributor authorSchuster, C.
date accessioned2020-03-12T23:33:38Z
date available2020-03-12T23:33:38Z
date issued2014
identifier other6899049.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1116045?show=full
formatgeneral
languageEnglish
publisherIEEE
titleProximity effects between striplines and vias
typeConference Paper
contenttypeMetadata Only
identifier padid8285582
subject keywordsindium compounds
subject keywordsnanostructured materials
subject keywordsohmic contacts
subject keywordssolar cells
subject keywordstin compounds
subject keywordsCdTe
subject keywordsITO
subject keywordsNC-based layers
subject keywordsblue-response
subject keywordscontact layers
subject keywordsdevice geometries
subject keywordsforward bias
subject keywordsink-based solar cells
subject keywordsnanocrystalline precursors
subject keywordsnanoscale engineering
subject keywordsohmic hole contact
subject keywordssintered films
subject keywordssolution-processed solar cells
subject keywordstetrapods
subject keywordsFilms
subject keywordsNanocrystals
subject keywordsPerformance evaluation
subject keywordsPhotovoltaic cells
subject keywordsScanning electron microscopy
subject keywordsSubstrates
subject keywordsZinc oxide
subject keywordsCadmium compounds
subject keywordsZinc compounds
subject keywordscontacts
subject keywordsnan
identifier doi10.1109/PVSC.2014.6925672
journal titlelectromagnetic Compatibility (EMC), 2014 IEEE International Symposium on
filesize1923763
citations0


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