| contributor author | Yandong He , Ganggang Zhang , Xing Zhang | |
| date accessioned | 2020-03-12T23:32:43Z | |
| date available | 2020-03-12T23:32:43Z | |
| date issued | 2014 | |
| identifier other | 6898175.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1115493?show=full | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Understanding of self-heating enhanced degradation in pLDMOSFETs by MR-DCIV method | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8284948 | |
| subject keywords | Detectors | |
| subject keywords | Image color analysis | |
| subject keywords | Image edge detection | |
| subject keywords | Lighting | |
| subject keywords | Markov random fields | |
| subject keywords | Robustness | |
| subject keywords | Transforms | |
| identifier doi | 10.1109/ISPACS.2014.7024479 | |
| journal title | hysical and Failure Analysis of Integrated Circuits (IPFA), 2014 IEEE 21st International Symposium o | |
| filesize | 284183 | |
| citations | 0 | |
