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Failure analysis for metal bridge defect in logic area of mixed-signal IC

contributor authorDiwei Fan , Wang, W.
date accessioned2020-03-12T23:32:38Z
date available2020-03-12T23:32:38Z
date issued2014
identifier other6898124.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1115443?show=full
formatgeneral
languageEnglish
publisherIEEE
titleFailure analysis for metal bridge defect in logic area of mixed-signal IC
typeConference Paper
contenttypeMetadata Only
identifier padid8284888
subject keywordsimage segmentation
subject keywordsimage texture
subject keywordsmammography
subject keywordsmedical image processing
subject keywordsprobability
subject keywordsvisual databases
subject keywordsadaptive probabilistic thresholding method
subject keywordsbreast region segmentation accuracy
subject keywordscontour growing methods
subject keywordsdigitized film based mammograms
subject keywordsgradient information
subject keywordsmini-MIAS database
subject keywordsobjective function
subject keywordsoptimal global threshold value
subject keywordstexture information
subject keywordsAccuracy
subject keywordsBreast
subject keywordsDatabases
subject keywordsDeformable models
subject keywordsImage segmentation
subject keywordsJoints
subject keywordsX-rays
subject keywordsAdaptive Thresholding
subject keywordsMammogram Segmentation
subject keywordsProbabilis
identifier doi10.1109/ICPR.2014.578
journal titlehysical and Failure Analysis of Integrated Circuits (IPFA), 2014 IEEE 21st International Symposium o
filesize5210198
citations0


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