Systematic study of RTN in nanowire transistor and enhanced RTN by hot carrier injection and negative bias temperature instability
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Year
: 2014DOI: 10.1109/APCAP.2014.6992481
Keyword(s): Antenna radiation patterns,Metals,Numerical models,Patch antennas,Stress,Thermal stresses,Co-simulation Methodology,Multi-physical Effects,Patch Antenna
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Systematic study of RTN in nanowire transistor and enhanced RTN by hot carrier injection and negative bias temperature instability
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| date accessioned | 2020-03-12T23:28:26Z | |
| date available | 2020-03-12T23:28:26Z | |
| date issued | 2014 | |
| identifier other | 6894417.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1112960 | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Systematic study of RTN in nanowire transistor and enhanced RTN by hot carrier injection and negative bias temperature instability | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8281946 | |
| subject keywords | Antenna radiation patterns | |
| subject keywords | Metals | |
| subject keywords | Numerical models | |
| subject keywords | Patch antennas | |
| subject keywords | Stress | |
| subject keywords | Thermal stresses | |
| subject keywords | Co-simulation Methodology | |
| subject keywords | Multi-physical Effects | |
| subject keywords | Patch Antenna | |
| identifier doi | 10.1109/APCAP.2014.6992481 | |
| journal title | LSI Technology (VLSI-Technology): Digest of Technical Papers, 2014 Symposium on | |
| filesize | 462833 | |
| citations | 0 | |
| contributor rawauthor | Ota, K. , Saitoh, M. , Tanaka, C. , Matsushita, D. , Numata, T. |