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A novel sparsity-inspired blind image quality assessment algorithm

contributor authorPriya, K.V.S.N.L.Manasa
contributor authorChannappayya, Sumohana S.
date accessioned2020-03-12T22:57:48Z
date available2020-03-12T22:57:48Z
date issued2014
identifier other7032268.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1100619?show=full
formatgeneral
languageEnglish
publisherIEEE
titleA novel sparsity-inspired blind image quality assessment algorithm
typeConference Paper
contenttypeMetadata Only
identifier padid8242780
subject keywordselectrochemical impedance spectroscopy
subject keywordsn elemental semiconductors
subject keywordsn nanocomposites
subject keywordsn oxidation
subject keywordsn porous semiconductors
subject keywordsn semiconductor-insulator boundaries
subject keywordsn silicon
subject keywordsn silicon compounds
subject keywordsn thermally stimulated currents
subject keywordsn Si-SiO<
subject keywordssub>
subject keywords2<
subject keywords/sub>
subject keywordsn complex relaxation processes
subject keywordsn density-of-states
subject keywordsn electric transport properties
subject keywordsn electrical capacity dispersion
subject keywordsn electrical properties
subject keywordsn frequency 25 Hz to 1 MHz
subject keywordsn frequency bands
subject keywordsn impedance s
identifier doi10.1109/OMEE.2014.6912357
journal titleignal and Information Processing (GlobalSIP), 2014 IEEE Global Conference on
filesize204007
citations0


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