Accelerated testing for electro-migration
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: 2014شناسه الکترونیک: 10.1109/IHMSC.2014.135
کلیدواژه(گان): Accuracy,n Detectors,n Feature extraction,n Image color analysis,n Robustness,n Skin,n Tracking,n hand detection,n hand tracking,n human computer interaction(HCI)
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Accelerated testing for electro-migration
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contributor author | Malucci, Robert D. | |
date accessioned | 2020-03-12T22:56:43Z | |
date available | 2020-03-12T22:56:43Z | |
date issued | 2014 | |
identifier other | 7031073.pdf | |
identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1099987 | |
format | general | |
language | English | |
publisher | IEEE | |
title | Accelerated testing for electro-migration | |
type | Conference Paper | |
contenttype | Metadata Only | |
identifier padid | 8241848 | |
subject keywords | Accuracy | |
subject keywords | n Detectors | |
subject keywords | n Feature extraction | |
subject keywords | n Image color analysis | |
subject keywords | n Robustness | |
subject keywords | n Skin | |
subject keywords | n Tracking | |
subject keywords | n hand detection | |
subject keywords | n hand tracking | |
subject keywords | n human computer interaction(HCI) | |
identifier doi | 10.1109/IHMSC.2014.135 | |
journal title | lectrical Contacts (Holm), 2014 IEEE 60th Holm Conference on | |
filesize | 703718 | |
citations | 0 |