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Phase Intensive Global Pattern for periocular recognition

Author:
Bakshi, Sambit
,
Sa, Pankaj K.
,
Majhi, Banshidhar
Publisher:
IEEE
Year
: 2014
DOI: 10.1109/EPE.2014.6910691
URI: https://libsearch.um.ac.ir:443/fum/handle/fum/1099283
Keyword(s): invertors,n minimisation,n permanent magnet machines,n stators,n synchronous machines,n torque control,n DB-DTFC,n FW-IPMSM test bench,n constant stator flux,n deadbeat direct torque and flux control,n dynamic flux,n flux linkage based inverter loss model,n flux weakening interior permanent magnet synchronous machine,n loss minimization,n optimal flux,n switching period,n Couplings,n Inverters,n Mathematical model,n Semiconductor diodes
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    Phase Intensive Global Pattern for periocular recognition

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contributor authorBakshi, Sambit
contributor authorSa, Pankaj K.
contributor authorMajhi, Banshidhar
date accessioned2020-03-12T22:55:31Z
date available2020-03-12T22:55:31Z
date issued2014
identifier other7030362.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1099283
formatgeneral
languageEnglish
publisherIEEE
titlePhase Intensive Global Pattern for periocular recognition
typeConference Paper
contenttypeMetadata Only
identifier padid8240861
subject keywordsinvertors
subject keywordsn minimisation
subject keywordsn permanent magnet machines
subject keywordsn stators
subject keywordsn synchronous machines
subject keywordsn torque control
subject keywordsn DB-DTFC
subject keywordsn FW-IPMSM test bench
subject keywordsn constant stator flux
subject keywordsn deadbeat direct torque and flux control
subject keywordsn dynamic flux
subject keywordsn flux linkage based inverter loss model
subject keywordsn flux weakening interior permanent magnet synchronous machine
subject keywordsn loss minimization
subject keywordsn optimal flux
subject keywordsn switching period
subject keywordsn Couplings
subject keywordsn Inverters
subject keywordsn Mathematical model
subject keywordsn Semiconductor diodes
identifier doi10.1109/EPE.2014.6910691
journal titlendia Conference (INDICON), 2014 Annual IEEE
filesize886301
citations0
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