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contributor authorChen, Eason
contributor authorLan, Albert
contributor authorYou, Jack
contributor authorLiao, Mark
date accessioned2020-03-12T22:53:24Z
date available2020-03-12T22:53:24Z
date issued2014
identifier other7028314.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1098098?show=full
formatgeneral
languageEnglish
publisherIEEE
titleStructure reliability and characterization for FC package w/Embedded Trace coreless Substrate
typeConference Paper
contenttypeMetadata Only
identifier padid8239149
subject keywordsRouting
subject keywordsn Location
subject keywordsn Shortest Path
subject keywordsn backtracking
subject keywordsn label setting
subject keywordsn label-correction
identifier doi10.1109/ICRAIE.2014.6909250
journal titlelectronics Packaging Technology Conference (EPTC), 2014 IEEE 16th
filesize200268
citations0


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