Big Data Density Analytics Using Parallel Coordinate Visualization
Publisher:
Year
: 2014DOI: 10.1109/APS.2014.6904479
Keyword(s): calibration,n integrated circuit measurement,n millimetre wave integrated circuits,n millimetre wave measurement,n submillimetre wave integrated circuits,n G-band,n IC,n frequency 140 GHz to 220 GHz,n frequency 60 GHz to 3 THz,n integrated circuit characterization,n noncontact device,n noncontact measurement probe technique,n on-wafer 2-port characterization,n on-wafer calibration standards,n passive millimeter wave components,n quasioptical nature
Collections
:
-
Statistics
Big Data Density Analytics Using Parallel Coordinate Visualization
Show full item record
| contributor author | Zhang, Jinson | |
| contributor author | Huang, Mao Lin | |
| contributor author | Wang, Wen Bo | |
| contributor author | Lu, Liang Fu | |
| contributor author | Meng, Zhao-Peng | |
| date accessioned | 2020-03-12T22:47:15Z | |
| date available | 2020-03-12T22:47:15Z | |
| date issued | 2014 | |
| identifier other | 7023729.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1094562 | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Big Data Density Analytics Using Parallel Coordinate Visualization | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8234493 | |
| subject keywords | calibration | |
| subject keywords | n integrated circuit measurement | |
| subject keywords | n millimetre wave integrated circuits | |
| subject keywords | n millimetre wave measurement | |
| subject keywords | n submillimetre wave integrated circuits | |
| subject keywords | n G-band | |
| subject keywords | n IC | |
| subject keywords | n frequency 140 GHz to 220 GHz | |
| subject keywords | n frequency 60 GHz to 3 THz | |
| subject keywords | n integrated circuit characterization | |
| subject keywords | n noncontact device | |
| subject keywords | n noncontact measurement probe technique | |
| subject keywords | n on-wafer 2-port characterization | |
| subject keywords | n on-wafer calibration standards | |
| subject keywords | n passive millimeter wave components | |
| subject keywords | n quasioptical nature | |
| identifier doi | 10.1109/APS.2014.6904479 | |
| journal title | omputational Science and Engineering (CSE), 2014 IEEE 17th International Conference on | |
| filesize | 418833 | |
| citations | 0 |