| contributor author | Cheung, Stephane |  | 
| contributor author | Shirai, Yasuyuki |  | 
| contributor author | Morita, Hiroyuki |  | 
| contributor author | Nakamoto, Masakazu |  | 
| date accessioned | 2020-03-12T22:45:30Z |  | 
| date available | 2020-03-12T22:45:30Z |  | 
| date issued | 2014 |  | 
| identifier other | 7022608.pdf |  | 
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1093527?show=full |  | 
| format | general |  | 
| language | English |  | 
| publisher | IEEE |  | 
| title | Understanding Changes in Customer Purchase Behavior: Study of Attenuation Model for Multiparametric Purchase Preferences |  | 
| type | Conference Paper |  | 
| contenttype | Metadata Only |  | 
| identifier padid | 8232968 |  | 
| subject keywords | CMOS integrated circuits |  | 
| subject keywords | n			MOSFET |  | 
| subject keywords | n			SRAM chips |  | 
| subject keywords | n			cache storage |  | 
| subject keywords | n			semiconductor device models |  | 
| subject keywords | n			CMOS process |  | 
| subject keywords | n			FinCACTI |  | 
| subject keywords | n			architectural analysis |  | 
| subject keywords | n			architecture-level simulations |  | 
| subject keywords | n			cache modeling tool |  | 
| subject keywords | n			deeply-scaled FinFET devices |  | 
| subject keywords | n			robust SRAM cells |  | 
| subject keywords | n			size 7 nm |  | 
| subject keywords | n			CMOS integrated circuits |  | 
| subject keywords | n			Capacitance |  | 
| subject keywords | n			FinFETs |  | 
| subject keywords | n			Logic gates |  | 
| subject keywords | n			SRAM cells |  | 
| subject keywords | n			Semiconductor device modeling |  | 
| subject keywords | n			CACTI |  | 
| subject keywords | n			Cache Modeling |  | 
| subject keywords | n			FinFET devices |  | 
| identifier doi | 10.1109/ISVLSI.2014.94 |  | 
| journal title | ata Mining Workshop (ICDMW), 2014 IEEE International Conference on |  | 
| filesize | 608597 |  | 
| citations | 0 |  |