Show simple item record

An Approach to Detecting Software Process Deviations

contributor authorZhu, Rui
contributor authorLi, Tong
contributor authorDai, Fei
contributor authorMo, Qi
contributor authorLin, Leilei
contributor authorHe, Yun
contributor authorChen, Yeting
date accessioned2020-03-12T22:44:44Z
date available2020-03-12T22:44:44Z
date issued2014
identifier other7021729.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1093091?show=full
formatgeneral
languageEnglish
publisherIEEE
titleAn Approach to Detecting Software Process Deviations
typeConference Paper
contenttypeMetadata Only
identifier padid8232414
subject keywordsdiffraction gratings
subject keywordsn germanium
subject keywordsn optical metamaterials
subject keywordsn quantum dots
subject keywordsn Ge
subject keywordsn directional emission
subject keywordsn enhanced light extraction
subject keywordsn germanium bull'
subject keywordss eye grating
subject keywordsn high-K modes
subject keywordsn hyperbolic metamaterial
subject keywordsn quantum dots
subject keywordsn Educational institutions
subject keywordsn Gratings
subject keywordsn Hidden Markov models
subject keywordsn High K dielectric materials
subject keywordsn Metamaterials
subject keywordsn Photonics
subject keywordsn Plasmons
subject keywordsn Metamaterials
subject keywordsn Plasmonics
subject keywordsn Quantum Dots
identifier doi10.1109/SUM.2014.11
journal titleT Convergence and Security (ICITCS), 2014 International Conference on
filesize268544
citations0


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following Collection(s)

Show simple item record