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Impacts of annealing processes on the electrical properties of gasb metal-oxide-semiconductor devices

contributor authorZhenhua Zeng
contributor authorBing Sun
contributor authorHudong Chang
contributor authorWei Zhao
contributor authorXu Yang
contributor authorJiahui Zhou
contributor authorShengkai Wang
contributor authorXiong Zhang
contributor authorYiping Cui
contributor authorHonggang Liu
date accessioned2020-03-12T22:44:35Z
date available2020-03-12T22:44:35Z
date issued2014
identifier other7021649.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1093006?show=full
formatgeneral
languageEnglish
publisherIEEE
titleImpacts of annealing processes on the electrical properties of gasb metal-oxide-semiconductor devices
typeConference Paper
contenttypeMetadata Only
identifier padid8232292
subject keywordsdatabase management systems
subject keywordsn software metrics
subject keywordsn color dimension
subject keywordsn hierarchical structures
subject keywordsn hierarchy element
subject keywordsn interaction techniques
subject keywordsn interactive similarity links
subject keywordsn mental map preservation
subject keywordsn software metrics
subject keywordsn software systems
subject keywordsn space-filling way
subject keywordsn standard treemap visualizations
subject keywordsn treemap box
subject keywordsn treemap visualizations
subject keywordsn Color
subject keywordsn Image color analysis
subject keywordsn Layout
subject keywordsn Organizations
subject keywordsn Software metrics
subject keywordsn Visualization
subject keywordsn Information hierarchies
identifier doi10.1109/IV.2014.35
journal titleolid-State and Integrated Circuit Technology (ICSICT), 2014 12th IEEE International Conference on
filesize958060
citations1


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