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Bias stress induced threshold voltage instability in solution processed organic thin film transistor

contributor authorYin Sun
contributor authorLining Zhang
contributor authorAhmed, Z.
contributor authorKabir, D.
contributor authorMansun Chan
date accessioned2020-03-12T22:44:34Z
date available2020-03-12T22:44:34Z
date issued2014
identifier other7021646.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1093003?show=full
formatgeneral
languageEnglish
publisherIEEE
titleBias stress induced threshold voltage instability in solution processed organic thin film transistor
typeConference Paper
contenttypeMetadata Only
identifier padid8232289
subject keywordscomputational complexity
subject keywordsn data visualisation
subject keywordsn graph theory
subject keywordsn pattern clustering
subject keywordsn LC
subject keywordsn SC1
subject keywordsn SC2
subject keywordsn clustered force-directed algorithm
subject keywordsn clustered graph drawing
subject keywordsn computational complexity
subject keywordsn convergence time
subject keywordsn graph visualization aesthetics
subject keywordsn large graph visualization
subject keywordsn large weighted graphs
subject keywordsn long convergence
subject keywordsn scalability problem
subject keywordsn short convergences
subject keywordsn Clustering algorithms
subject keywordsn Clustering methods
subject keywordsn Convergence
subject keywordsn Data visualization
identifier doi10.1109/IV.2014.24
journal titleolid-State and Integrated Circuit Technology (ICSICT), 2014 12th IEEE International Conference on
filesize708987
citations0


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