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Assessing representation techniques of programs supported by GreedEx

contributor authorMolina, A.I.
contributor authorParedes, M.
contributor authorRedondo, M.A.
contributor authorVelazquez, A.
date accessioned2020-03-12T22:38:26Z
date available2020-03-12T22:38:26Z
date issued2014
identifier other7017704.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1089632?show=full
formatgeneral
languageEnglish
publisherIEEE
titleAssessing representation techniques of programs supported by GreedEx
typeConference Paper
contenttypeMetadata Only
identifier padid8227889
subject keywordsatomic force microscopy
subject keywordsn buried layers
subject keywordsn failure analysis
subject keywordsn semiconductor technology
subject keywordsn silicon-on-insulator
subject keywordsn SOI wafer
subject keywordsn buried oxide layer
subject keywordsn conductive atomic force microscopy
subject keywordsn die level failure analysis
subject keywordsn local defect isolation
subject keywordsn scanning capacitance microscopy
subject keywordsn silicon on insulator wafer
subject keywordsn Capacitance
subject keywordsn Failure analysis
subject keywordsn Layout
subject keywordsn Microscopy
subject keywordsn Probes
subject keywordsn Silicon
subject keywordsn Silicon-on-insulator
identifier doi10.1109/IPFA.2014.6898163
journal titleomputers in Education (SIIE), 2014 International Symposium on
filesize463760
citations0


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