[Copyright notice]
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سال
: 2014شناسه الکترونیک: 10.1109/IPFA.2014.6898150
کلیدواژه(گان): power MOSFET,n semiconductor device testing,n time-domain reflectometry,n TDR measurement,n power MOSFET,n repeatability test,n signal instability,n time domain reflectometry measurement,n Fixtures,n Force,n Impedance,n Impedance measurement,n MOSFET,n Probes,n Transmission line measurements
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[Copyright notice]
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| date accessioned | 2020-03-12T22:38:24Z | |
| date available | 2020-03-12T22:38:24Z | |
| date issued | 2014 | |
| identifier other | 7017691.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1089619 | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | [Copyright notice] | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8227872 | |
| subject keywords | power MOSFET | |
| subject keywords | n semiconductor device testing | |
| subject keywords | n time-domain reflectometry | |
| subject keywords | n TDR measurement | |
| subject keywords | n power MOSFET | |
| subject keywords | n repeatability test | |
| subject keywords | n signal instability | |
| subject keywords | n time domain reflectometry measurement | |
| subject keywords | n Fixtures | |
| subject keywords | n Force | |
| subject keywords | n Impedance | |
| subject keywords | n Impedance measurement | |
| subject keywords | n MOSFET | |
| subject keywords | n Probes | |
| subject keywords | n Transmission line measurements | |
| identifier doi | 10.1109/IPFA.2014.6898150 | |
| journal title | omputers in Education (SIIE), 2014 International Symposium on | |
| filesize | 60584 | |
| citations | 0 |