| contributor author | Yajima, R. | |
| contributor author | Nagatani, K. | |
| contributor author | Yoshida, K. | |
| date accessioned | 2020-03-12T22:38:23Z | |
| date available | 2020-03-12T22:38:23Z | |
| date issued | 2014 | |
| identifier other | 7017680.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1089608?show=full | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Development and field testing of UAV-based sampling devices for obtaining volcanic products | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8227859 | |
| subject keywords | MOSFET | |
| subject keywords | n X-ray chemical analysis | |
| subject keywords | n failure analysis | |
| subject keywords | n molybdenum | |
| subject keywords | n moulding | |
| subject keywords | n semiconductor device reliability | |
| subject keywords | n zinc | |
| subject keywords | n EDX | |
| subject keywords | n TIVA | |
| subject keywords | n Zn-Mo | |
| subject keywords | n failure analysis | |
| subject keywords | n gate-source short | |
| subject keywords | n molding compound | |
| subject keywords | n nonpassivated MOSFET device | |
| subject keywords | n particle defect | |
| subject keywords | n Circuit faults | |
| subject keywords | n Compounds | |
| subject keywords | n Failure analysis | |
| subject keywords | n Logic gates | |
| subject keywords | n Optical imaging | |
| subject keywords | n Zinc | |
| identifier doi | 10.1109/IPFA.2014.6898140 | |
| journal title | afety, Security, and Rescue Robotics (SSRR), 2014 IEEE International Symposium on | |
| filesize | 1836873 | |
| citations | 0 | |