A nonparallel hexrotor UAV with faster response to disturbances for precision position keeping
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سال
: 2014شناسه الکترونیک: 10.1109/IPFA.2014.6898129
کلیدواژه(گان): focused ion beam technology,n semiconductor technology,n transmission electron microscopy,n advanced semiconductor device analysis,n curtaining effect,n ex situ lift out,n inverted FIB thinning,n inverted sample thinning method,n ultrathin TEM specimens,n Copper,n Films,n Geometry,n Ion beams,n Needles,n Probes,n Silicon
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A nonparallel hexrotor UAV with faster response to disturbances for precision position keeping
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contributor author | Guangying Jiang | |
contributor author | Voyles, R. | |
date accessioned | 2020-03-12T22:38:22Z | |
date available | 2020-03-12T22:38:22Z | |
date issued | 2014 | |
identifier other | 7017669.pdf | |
identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1089597 | |
format | general | |
language | English | |
publisher | IEEE | |
title | A nonparallel hexrotor UAV with faster response to disturbances for precision position keeping | |
type | Conference Paper | |
contenttype | Metadata Only | |
identifier padid | 8227844 | |
subject keywords | focused ion beam technology | |
subject keywords | n semiconductor technology | |
subject keywords | n transmission electron microscopy | |
subject keywords | n advanced semiconductor device analysis | |
subject keywords | n curtaining effect | |
subject keywords | n ex situ lift out | |
subject keywords | n inverted FIB thinning | |
subject keywords | n inverted sample thinning method | |
subject keywords | n ultrathin TEM specimens | |
subject keywords | n Copper | |
subject keywords | n Films | |
subject keywords | n Geometry | |
subject keywords | n Ion beams | |
subject keywords | n Needles | |
subject keywords | n Probes | |
subject keywords | n Silicon | |
identifier doi | 10.1109/IPFA.2014.6898129 | |
journal title | afety, Security, and Rescue Robotics (SSRR), 2014 IEEE International Symposium on | |
filesize | 1090603 | |
citations | 0 |