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contributor authorRungsirikunnan, C.
contributor authorChusri, Y.
contributor authorNaiyanetr, P.
date accessioned2020-03-12T22:38:14Z
date available2020-03-12T22:38:14Z
date issued2014
identifier other7017427.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1089531?show=full
formatgeneral
languageEnglish
publisherIEEE
titleControl system design for external continuous flow centrifugal VAD
typeConference Paper
contenttypeMetadata Only
identifier padid8227758
subject keywordsageing
subject keywordsn aluminium
subject keywordsn copper
subject keywordsn corrosion resistance
subject keywordsn failure analysis
subject keywordsn integrated circuit interconnections
subject keywordsn lead bonding
subject keywordsn semiconductor device packaging
subject keywordsn semiconductor device reliability
subject keywordsn Cu-Al
subject keywordsn IMC thickness
subject keywordsn Levenberg-Marquardt algorithm
subject keywordsn Parr Bomb technique
subject keywordsn X-ray microCT
subject keywordsn accelerated testing
subject keywordsn copper wire bonding technology
subject keywordsn electrical resistance
subject keywordsn failure assessment
subject keywordsn failure mechanism
subject keywordsn first-level interconnect
subject keywordsn gold w
identifier doi10.1109/ECTC.2014.6897573
journal titleiomedical Engineering International Conference (BMEiCON), 2014 7th
filesize1455483
citations0


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