| date accessioned | 2020-03-12T22:37:41Z | |
| date available | 2020-03-12T22:37:41Z | |
| date issued | 2014 | |
| identifier other | 7017146.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1089231?show=full | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | [Front cover] | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8227408 | |
| subject keywords | Fourier transform spectroscopy | |
| subject keywords | n X-ray microscopy | |
| subject keywords | n X-ray photoelectron spectra | |
| subject keywords | n ageing | |
| subject keywords | n automotive electronics | |
| subject keywords | n encapsulation | |
| subject keywords | n failure analysis | |
| subject keywords | n gold | |
| subject keywords | n infrared spectroscopy | |
| subject keywords | n integrated circuit packaging | |
| subject keywords | n integrated circuit reliability | |
| subject keywords | n integrated circuit testing | |
| subject keywords | n leakage currents | |
| subject keywords | n moulding | |
| subject keywords | n plastic packaging | |
| subject keywords | n Au | |
| subject keywords | n DMA | |
| subject keywords | n EMC | |
| subject keywords | n FTIR | |
| subject keywords | n MC candidates | |
| subject keywords | n PEM | |
| subject keywords | n Pd-Al | |
| subject keywords | n SOIC devices | |
| subject keywords | n X-ray inspection | |
| subject keywords | n XPS tests | |
| identifier doi | 10.1109/ECTC.2014.6897295 | |
| journal title | nderwater Communications and Networking (UComms), 2014 | |
| filesize | 65167 | |
| citations | 0 | |
