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A new SOC estimation algorithm without integrated error using DCIR repetitive calculation

Author:
Yong-Ki Cho
,
Yong-Min Jeong
,
Jung-Hoon Ahn
,
Seung-Hee Ryu
,
Byoung-Kuk Lee
Publisher:
IEEE
Year
: 2014
DOI: 10.1109/ECS.2014.6892735
URI: https://libsearch.um.ac.ir:443/fum/handle/fum/1086252
Keyword(s): electron transport theory,n nanofabrication,n nanowires,n transistors,n RF characteristics,n electron transport phenomenon,n energy band formation,n gate length E-mode junctionless nanowire transistor,n gate length nonplanar ultrathin JNT,n high frequency high microwave performance,n mobility performance,n size 30 nm,n Clocks,n FinFETs,n Logic gates,n Market research,n Performance evaluation,n Radio frequency,n Silicon,n Electric field
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    A new SOC estimation algorithm without integrated error using DCIR repetitive calculation

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contributor authorYong-Ki Cho
contributor authorYong-Min Jeong
contributor authorJung-Hoon Ahn
contributor authorSeung-Hee Ryu
contributor authorByoung-Kuk Lee
date accessioned2020-03-12T22:32:11Z
date available2020-03-12T22:32:11Z
date issued2014
identifier other7013590.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1086252
formatgeneral
languageEnglish
publisherIEEE
titleA new SOC estimation algorithm without integrated error using DCIR repetitive calculation
typeConference Paper
contenttypeMetadata Only
identifier padid8223901
subject keywordselectron transport theory
subject keywordsn nanofabrication
subject keywordsn nanowires
subject keywordsn transistors
subject keywordsn RF characteristics
subject keywordsn electron transport phenomenon
subject keywordsn energy band formation
subject keywordsn gate length E-mode junctionless nanowire transistor
subject keywordsn gate length nonplanar ultrathin JNT
subject keywordsn high frequency high microwave performance
subject keywordsn mobility performance
subject keywordsn size 30 nm
subject keywordsn Clocks
subject keywordsn FinFETs
subject keywordsn Logic gates
subject keywordsn Market research
subject keywordsn Performance evaluation
subject keywordsn Radio frequency
subject keywordsn Silicon
subject keywordsn Electric field
identifier doi10.1109/ECS.2014.6892735
journal titlelectrical Machines and Systems (ICEMS), 2014 17th International Conference on
filesize646799
citations0
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