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Investigation of defects in GaN HFET structures by electroluminescence

date accessioned2020-03-12T22:14:15Z
date available2020-03-12T22:14:15Z
date issued2014
identifier other6998662.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1075992?locale-attribute=en&show=full
formatgeneral
languageEnglish
publisherIEEE
titleInvestigation of defects in GaN HFET structures by electroluminescence
typeConference Paper
contenttypeMetadata Only
identifier padid8212183
subject keywordsradar imaging
subject keywordsn Snell law
subject keywordsn back projection imaging
subject keywordsn fast compensation algorithm
subject keywordsn fast wall compensation algorithm
subject keywordsn focusing delay
subject keywordsn image defocusing
subject keywordsn multiple wall hidden target
subject keywordsn refraction point
subject keywordsn target position
subject keywordsn through-wall radar imaging
subject keywordsn Antennas
subject keywordsn Delays
subject keywordsn Electromagnetic scattering
subject keywordsn Focusing
subject keywordsn Mathematical model
subject keywordsn Radar imaging
identifier doi10.1109/RADAR.2014.6875775
journal titledvanced Semiconductor Devices & Microsystems (ASDAM), 2014 10th International Conference on
filesize221429
citations0


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