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Index

Publisher:
IEEE
Year
: 2014
DOI: 10.1109/IOLTS.2014.6873698
URI: https://libsearch.um.ac.ir:443/fum/handle/fum/1074238
Keyword(s): circuit reliability,n circuit testing,n failure analysis,n network synthesis,n failure analysis methods,n in-circuit critical parameter monitoring,n innovative standard cells remapping method,n monitoring functions,n oxide thickness monitoring,n post-layout simulations,n test vehicle,n topological exchange,n Capacitance,n Frequency measurement,n Logic gates,n Metals,n Monitoring,n Standards,n Topology,n monitoring function,n standard ce
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date accessioned2020-03-12T22:10:55Z
date available2020-03-12T22:10:55Z
date issued2014
identifier other6996814.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1074238
formatgeneral
languageEnglish
publisherIEEE
titleIndex
typeConference Paper
contenttypeMetadata Only
identifier padid8210373
subject keywordscircuit reliability
subject keywordsn circuit testing
subject keywordsn failure analysis
subject keywordsn network synthesis
subject keywordsn failure analysis methods
subject keywordsn in-circuit critical parameter monitoring
subject keywordsn innovative standard cells remapping method
subject keywordsn monitoring functions
subject keywordsn oxide thickness monitoring
subject keywordsn post-layout simulations
subject keywordsn test vehicle
subject keywordsn topological exchange
subject keywordsn Capacitance
subject keywordsn Frequency measurement
subject keywordsn Logic gates
subject keywordsn Metals
subject keywordsn Monitoring
subject keywordsn Standards
subject keywordsn Topology
subject keywordsn monitoring function
subject keywordsn standard ce
identifier doi10.1109/IOLTS.2014.6873698
journal titleetworks and Optical Communications - (NOC), 2014 19th European Conference on
filesize32160
citations0
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