Index

ناشر:
سال
: 2014
شناسه الکترونیک: 10.1109/IOLTS.2014.6873698
کلیدواژه(گان): circuit reliability,n circuit testing,n failure analysis,n network synthesis,n failure analysis methods,n in-circuit critical parameter monitoring,n innovative standard cells remapping method,n monitoring functions,n oxide thickness monitoring,n post-layout simulations,n test vehicle,n topological exchange,n Capacitance,n Frequency measurement,n Logic gates,n Metals,n Monitoring,n Standards,n Topology,n monitoring function,n standard ce
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