An experimental research of love wave sensor based on LiTaO<inf>3</inf>/SiO<inf>2</inf> structure
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سال
: 2014شناسه الکترونیک: 10.1109/IOLTS.2014.6873696
کلیدواژه(گان): MOSFET,n driver circuits,n radiation hardening (electronics),n silicon-on-insulator,n storage management chips,n 8T footless storage element,n 8T soft-error tolerant cell,n FF-DICE,n IDG FinFET dual gate mutual coupling,n NMOS access transistors,n NMOS drivers,n footless-FinFET-DICE,n independent dual gate SOI FinFET,n particle strikes,n regular memory cell,n single event upsets,n soft error resilience characteristics,n soft-error immunity
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An experimental research of love wave sensor based on LiTaO<inf>3</inf>/SiO<inf>2</inf> structure
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| contributor author | Chen, Gui | |
| contributor author | Xie, Xiao | |
| contributor author | Wang, Wen | |
| contributor author | He, Shitang | |
| date accessioned | 2020-03-12T22:10:55Z | |
| date available | 2020-03-12T22:10:55Z | |
| date issued | 2014 | |
| identifier other | 6996811.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1074236 | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | An experimental research of love wave sensor based on LiTaO<inf>3</inf>/SiO<inf>2</inf> structure | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8210371 | |
| subject keywords | MOSFET | |
| subject keywords | n driver circuits | |
| subject keywords | n radiation hardening (electronics) | |
| subject keywords | n silicon-on-insulator | |
| subject keywords | n storage management chips | |
| subject keywords | n 8T footless storage element | |
| subject keywords | n 8T soft-error tolerant cell | |
| subject keywords | n FF-DICE | |
| subject keywords | n IDG FinFET dual gate mutual coupling | |
| subject keywords | n NMOS access transistors | |
| subject keywords | n NMOS drivers | |
| subject keywords | n footless-FinFET-DICE | |
| subject keywords | n independent dual gate SOI FinFET | |
| subject keywords | n particle strikes | |
| subject keywords | n regular memory cell | |
| subject keywords | n single event upsets | |
| subject keywords | n soft error resilience characteristics | |
| subject keywords | n soft-error immunity | |
| identifier doi | 10.1109/IOLTS.2014.6873696 | |
| journal title | iezoelectricity, Acoustic Waves, and Device Applications (SPAWDA), 2014 Symposium on | |
| filesize | 1311705 | |
| citations | 0 |