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An experimental research of love wave sensor based on LiTaO<inf>3</inf>/SiO<inf>2</inf> structure

Author:
Chen, Gui
,
Xie, Xiao
,
Wang, Wen
,
He, Shitang
Publisher:
IEEE
Year
: 2014
DOI: 10.1109/IOLTS.2014.6873696
URI: https://libsearch.um.ac.ir:443/fum/handle/fum/1074236
Keyword(s): MOSFET,n driver circuits,n radiation hardening (electronics),n silicon-on-insulator,n storage management chips,n 8T footless storage element,n 8T soft-error tolerant cell,n FF-DICE,n IDG FinFET dual gate mutual coupling,n NMOS access transistors,n NMOS drivers,n footless-FinFET-DICE,n independent dual gate SOI FinFET,n particle strikes,n regular memory cell,n single event upsets,n soft error resilience characteristics,n soft-error immunity
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    An experimental research of love wave sensor based on LiTaO&lt;inf&gt;3&lt;/inf&gt;/SiO&lt;inf&gt;2&lt;/inf&gt; structure

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contributor authorChen, Gui
contributor authorXie, Xiao
contributor authorWang, Wen
contributor authorHe, Shitang
date accessioned2020-03-12T22:10:55Z
date available2020-03-12T22:10:55Z
date issued2014
identifier other6996811.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1074236
formatgeneral
languageEnglish
publisherIEEE
titleAn experimental research of love wave sensor based on LiTaO<inf>3</inf>/SiO<inf>2</inf> structure
typeConference Paper
contenttypeMetadata Only
identifier padid8210371
subject keywordsMOSFET
subject keywordsn driver circuits
subject keywordsn radiation hardening (electronics)
subject keywordsn silicon-on-insulator
subject keywordsn storage management chips
subject keywordsn 8T footless storage element
subject keywordsn 8T soft-error tolerant cell
subject keywordsn FF-DICE
subject keywordsn IDG FinFET dual gate mutual coupling
subject keywordsn NMOS access transistors
subject keywordsn NMOS drivers
subject keywordsn footless-FinFET-DICE
subject keywordsn independent dual gate SOI FinFET
subject keywordsn particle strikes
subject keywordsn regular memory cell
subject keywordsn single event upsets
subject keywordsn soft error resilience characteristics
subject keywordsn soft-error immunity
identifier doi10.1109/IOLTS.2014.6873696
journal titleiezoelectricity, Acoustic Waves, and Device Applications (SPAWDA), 2014 Symposium on
filesize1311705
citations0
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