Gaze estimation as a framework for iris liveness detection
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Year
: 2014DOI: 10.1109/DRC.2014.6872382
Keyword(s): CMOS analogue integrated circuits,n MOSFET,n elemental semiconductors,n etching,n flexible electronics,n silicon-on-insulator,n 3D FinFET CMOS,n CMOS compatible fabrication technique,n CMOS compatible soft etch back,n Si,n flexible electronics,n fully-integrated low-cost system,n high-performance flexible CMOS SOI FinFET,n high-performance ultramobile consumer application,n low-melting point plastics,n low-temperature process,n multiple-gate electr
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Gaze estimation as a framework for iris liveness detection
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| contributor author | Rigas, Ioannis | |
| contributor author | Komogortsev, Oleg V. | |
| date accessioned | 2020-03-12T22:10:00Z | |
| date available | 2020-03-12T22:10:00Z | |
| date issued | 2014 | |
| identifier other | 6996282.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1073765 | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Gaze estimation as a framework for iris liveness detection | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8209889 | |
| subject keywords | CMOS analogue integrated circuits | |
| subject keywords | n MOSFET | |
| subject keywords | n elemental semiconductors | |
| subject keywords | n etching | |
| subject keywords | n flexible electronics | |
| subject keywords | n silicon-on-insulator | |
| subject keywords | n 3D FinFET CMOS | |
| subject keywords | n CMOS compatible fabrication technique | |
| subject keywords | n CMOS compatible soft etch back | |
| subject keywords | n Si | |
| subject keywords | n flexible electronics | |
| subject keywords | n fully-integrated low-cost system | |
| subject keywords | n high-performance flexible CMOS SOI FinFET | |
| subject keywords | n high-performance ultramobile consumer application | |
| subject keywords | n low-melting point plastics | |
| subject keywords | n low-temperature process | |
| subject keywords | n multiple-gate electr | |
| identifier doi | 10.1109/DRC.2014.6872382 | |
| journal title | iometrics (IJCB), 2014 IEEE International Joint Conference on | |
| filesize | 375036 | |
| citations | 0 |