Show simple item record

Study and analysis of conduction mechanisms and space charge accumulation phenomena under high applied DC electric field in XLPE for HVDC cable application

contributor authorHascoat, A.
contributor authorCastellon, J.
contributor authorAgnel, S.
contributor authorFrelin, W.
contributor authorEgrot, P
contributor authorHondaa, P.
contributor authorAmmi, S.
contributor authorLe Roux, D.
date accessioned2020-03-12T22:09:33Z
date available2020-03-12T22:09:33Z
date issued2014
identifier other6995877.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1073534?show=full
formatgeneral
languageEnglish
publisherIEEE
titleStudy and analysis of conduction mechanisms and space charge accumulation phenomena under high applied DC electric field in XLPE for HVDC cable application
typeConference Paper
contenttypeMetadata Only
identifier padid8209655
subject keywordsMonte Carlo methods
subject keywordsn elastic constants
subject keywordsn membranes
subject keywordsn micromechanical devices
subject keywordsn MEMS membrane stiffness
subject keywordsn Monte Carlo modeling
subject keywordsn membrane length-to-width ratio
subject keywordsn microelectromechanical systems
subject keywordsn rectangular membrane
subject keywordsn simulation step
subject keywordsn statistical approach
subject keywordsn stiffness estimation
subject keywordsn Biomembranes
subject keywordsn Monte Carlo methods
subject keywordsn Performance evaluation
subject keywordsn Silicon
subject keywordsn Springs
subject keywordsn Standards
subject keywordsn Stress
subject keywordsn MEMS
subject keywordsn Monte Carlo
subject keywordsn membrane
subject keywordsn stiffness
identifier doi10.1109/MIXDES.2014.6872163
journal titlelectrical Insulation and Dielectric Phenomena (CEIDP), 2014 IEEE Conference on
filesize763681
citations0


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following Collection(s)

Show simple item record