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Upgrade test capability for ±800kV/6250A and ±1100kV/5454A UHVDC valve

contributor authorGao, Ch.
contributor authorZha, K.P.
contributor authorTang, G.F.
contributor authorWang, X.H.
contributor authorWang, G.Y.
contributor authorZhou, J.C.
date accessioned2020-03-12T22:07:26Z
date available2020-03-12T22:07:26Z
date issued2014
identifier other6993863.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1072247?locale-attribute=en&show=full
formatgeneral
languageEnglish
publisherIEEE
titleUpgrade test capability for ±800kV/6250A and ±1100kV/5454A UHVDC valve
typeConference Paper
contenttypeMetadata Only
identifier padid8208331
subject keywordsageing
subject keywordsn condition monitoring
subject keywordsn invertors
subject keywordsn power MOSFET
subject keywordsn power semiconductor devices
subject keywordsn time-domain reflectometry
subject keywordsn SSTDR
subject keywordsn condition monitoring
subject keywordsn impedance variations
subject keywordsn live grid-tied PV inverter
subject keywordsn natural degradation-aging
subject keywordsn power MOSFET
subject keywordsn power semiconductor devices
subject keywordsn spread spectrum time domain reflectometry
subject keywordsn switching devices
subject keywordsn Impedance
subject keywordsn Integrated circuit reliability
subject keywordsn Inverters
subject keywordsn Monitoring
subject keywordsn Power measurement
subject keywordsn PV inverter
identifier doi10.1109/IPEC.2014.6869888
journal titleower System Technology (POWERCON), 2014 International Conference on
filesize2238761
citations0


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