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Cross-cultural mood regression for music digital libraries

contributor authorHu, Xiao
contributor authorYang, Yi-Hsuan
date accessioned2020-03-12T22:00:09Z
date available2020-03-12T22:00:09Z
date issued2014
identifier other6970230.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1068000?show=full
formatgeneral
languageEnglish
publisherIEEE
titleCross-cultural mood regression for music digital libraries
typeConference Paper
contenttypeMetadata Only
identifier padid8202939
subject keywordsIMPATT diodes
subject keywordsn numerical analysis
subject keywordsn silicon compounds
subject keywordsn wide band gap semiconductors
subject keywordsn IMPATT diodes
subject keywordsn SiC
subject keywordsn breakdown voltage
subject keywordsn dc-to-rf conversion efficiency
subject keywordsn drift zone voltage drop
subject keywordsn hole ionization rates
subject keywordsn impact avalanche transit time devices
subject keywordsn impact-ionization-avalanche-transit-time diodes
subject keywordsn lower electron rates
subject keywordsn numerical simulation
subject keywordsn one-dimensional current flow
subject keywordsn Charge carrier processes
subject keywordsn Integrated circuit modeling
subject keywordsn Ionization
identifier doi10.1109/IWJT.2014.6842037
journal titleigital Libraries (JCDL), 2014 IEEE/ACM Joint Conference on
filesize265610
citations0


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