contributor author | Beiu, Valeriu | |
contributor author | Daus, Leonard | |
date accessioned | 2020-03-12T21:57:36Z | |
date available | 2020-03-12T21:57:36Z | |
date issued | 2014 | |
identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1066513?show=full | |
format | general | |
language | English | |
publisher | IEEE | |
title | Review of reliability bounds for consecutive-k-out-of-n systems | |
type | Conference Paper | |
contenttype | Metadata Only | |
identifier padid | 8200563 | |
subject keywords | PWM invertors | |
subject keywords | n fast Fourier transforms | |
subject keywords | n harmonic analysis | |
subject keywords | n switches | |
subject keywords | n topology | |
subject keywords | n DC sources | |
subject keywords | n MLI | |
subject keywords | n fast Fourier transform window | |
subject keywords | n harmonic spectrum | |
subject keywords | n high power medium voltage energy control | |
subject keywords | n level shifted PWM technique | |
subject keywords | n multilevel inverter technology | |
subject keywords | n semiconductor switches | |
subject keywords | n seven level symmetric inverter | |
subject keywords | n Educational institutions | |
subject keywords | n Inverters | |
subject keywords | n Phase modulation | |
subject keywords | n Pulse width modulation | |
subject keywords | n Stress | |
subject keywords | n Switches | |
subject keywords | n Topology | |
subject keywords | n Mult | |
identifier doi | 10.1109/ICAEE.2014.6838484 | |
journal title | anotechnology (IEEE-NANO), 2014 IEEE 14th International Conference on | |
filesize | 1033753 | |
citations | 0 | |