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Review of reliability bounds for consecutive-k-out-of-n systems

contributor authorBeiu, Valeriu
contributor authorDaus, Leonard
date accessioned2020-03-12T21:57:36Z
date available2020-03-12T21:57:36Z
date issued2014
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1066513?locale-attribute=en&show=full
formatgeneral
languageEnglish
publisherIEEE
titleReview of reliability bounds for consecutive-k-out-of-n systems
typeConference Paper
contenttypeMetadata Only
identifier padid8200563
subject keywordsPWM invertors
subject keywordsn fast Fourier transforms
subject keywordsn harmonic analysis
subject keywordsn switches
subject keywordsn topology
subject keywordsn DC sources
subject keywordsn MLI
subject keywordsn fast Fourier transform window
subject keywordsn harmonic spectrum
subject keywordsn high power medium voltage energy control
subject keywordsn level shifted PWM technique
subject keywordsn multilevel inverter technology
subject keywordsn semiconductor switches
subject keywordsn seven level symmetric inverter
subject keywordsn Educational institutions
subject keywordsn Inverters
subject keywordsn Phase modulation
subject keywordsn Pulse width modulation
subject keywordsn Stress
subject keywordsn Switches
subject keywordsn Topology
subject keywordsn Mult
identifier doi10.1109/ICAEE.2014.6838484
journal titleanotechnology (IEEE-NANO), 2014 IEEE 14th International Conference on
filesize1033753
citations0


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