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In-situ characterization of 2D materials for beyond CMOS applications

contributor authorWallace, Robert M.
date accessioned2020-03-12T21:57:26Z
date available2020-03-12T21:57:26Z
date issued2014
identifier other6967958.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1066421?show=full
formatgeneral
languageEnglish
publisherIEEE
titleIn-situ characterization of 2D materials for beyond CMOS applications
typeConference Paper
contenttypeMetadata Only
identifier padid8200426
subject keywordsIP networks
subject keywordsn cloud computing
subject keywordsn computer centres
subject keywordsn local area networks
subject keywordsn DCN
subject keywordsn Ethernet-IP style protocols
subject keywordsn OpenFlow-based approach
subject keywordsn cloud computing
subject keywordsn data center networks
subject keywordsn fat-tree model
subject keywordsn scalable failover method
subject keywordsn Control systems
subject keywordsn Downlink
subject keywordsn Network topology
subject keywordsn Ports (Computers)
subject keywordsn Protocols
subject keywordsn Routing
subject keywordsn Topology
subject keywordsn Data Center Network
subject keywordsn Failover
subject keywordsn Fat-Tree
subject keywordsn OpenFlow
identifier doi10.1109/NOMS.2014.6838393
journal titleanotechnology (IEEE-NANO), 2014 IEEE 14th International Conference on
filesize340668
citations0


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