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Distribution high impedance fault location using localized voltage magnitude measurements

contributor authorHossain, Shamina
contributor authorZhu, Hao
contributor authorOverbye, Thomas
date accessioned2020-03-12T21:55:13Z
date available2020-03-12T21:55:13Z
date issued2014
identifier other6965403.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1065140?show=full
formatgeneral
languageEnglish
publisherIEEE
titleDistribution high impedance fault location using localized voltage magnitude measurements
typeConference Paper
contenttypeMetadata Only
identifier padid8198447
subject keywordsautomotive electronics
subject keywordsn embedded systems
subject keywordsn innovation management
subject keywordsn integrated circuits
subject keywordsn road safety
subject keywordsn system-on-chip
subject keywordsn accelerated system challenges
subject keywordsn automobile electronics
subject keywordsn consumer demand
subject keywordsn electronic innovation
subject keywordsn emission standards
subject keywordsn integrated circuit module development
subject keywordsn integrated sensing systems
subject keywordsn safe system design
subject keywordsn system-on-chip integration
subject keywordsn Acceleration
subject keywordsn Automobiles
subject keywordsn Internet
subject keywordsn Sensors
subject keywordsn Software
subject keywordsn Standards
subject keywordsn Tech
identifier doi10.1109/VLSI-DAT.2014.6834924
journal titleorth American Power Symposium (NAPS), 2014
filesize205540
citations0


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