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Diagnosis of segment delay defects with current sensing

contributor authorAljubouri, W.
contributor authorSomashekar, A.M.
contributor authorHaniotakis, T.
contributor authorTragoudas, S.
date accessioned2020-03-12T21:52:04Z
date available2020-03-12T21:52:04Z
date issued2014
identifier other6962101.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1063342?locale-attribute=en&show=full
formatgeneral
languageEnglish
publisherIEEE
titleDiagnosis of segment delay defects with current sensing
typeConference Paper
contenttypeMetadata Only
identifier padid8195488
subject keywordsproject management
subject keywordsn software architecture
subject keywordsn software maintenance
subject keywordsn software prototyping
subject keywordsn software quality
subject keywordsn Scrum project
subject keywordsn agile development processes
subject keywordsn architecture design
subject keywordsn development speed
subject keywordsn epic-architectures
subject keywordsn high quality products
subject keywordsn joint research and development laboratory
subject keywordsn lightweight architecting
subject keywordsn maintainable solutions
subject keywordsn planning horizon
subject keywordsn project agility
subject keywordsn refactoring effort
subject keywordsn user stories
subject keywordsn Collaboration
subject keywordsn Computer archit
identifier doi10.1109/WICSA.2014.38
journal titleefect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2014 IEEE International Symposiu
filesize208577
citations0


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