On Frequency Offset Estimation Using the iNET Preamble in Frequency Selective Fading
Publisher:
Year
: 2014DOI: 10.1109/EuroSimE.2014.6813834
Keyword(s): CMOS integrated circuits,n aluminium,n finite element analysis,n integrated circuit reliability,n internal stresses,n microsensors,n optimisation,n protective coatings,n titanium compounds,n Al-TiN,n CMOS-MEMS,n FEM,n Stoney formula,n bi-layered structure,n bilayered aluminum structure,n comb-shaped structure,n complementary metal oxide semiconductor,n cross-shaped sensor,n cross-shaped structure,n finite element method,n full-wafer coa
Collections
:
-
Statistics
On Frequency Offset Estimation Using the iNET Preamble in Frequency Selective Fading
Show full item record
| contributor author | Rice, Michael | |
| contributor author | Perrins, Erik | |
| date accessioned | 2020-03-12T21:45:10Z | |
| date available | 2020-03-12T21:45:10Z | |
| date issued | 2014 | |
| identifier other | 6956844.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1059186?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | On Frequency Offset Estimation Using the iNET Preamble in Frequency Selective Fading | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8190706 | |
| subject keywords | CMOS integrated circuits | |
| subject keywords | n aluminium | |
| subject keywords | n finite element analysis | |
| subject keywords | n integrated circuit reliability | |
| subject keywords | n internal stresses | |
| subject keywords | n microsensors | |
| subject keywords | n optimisation | |
| subject keywords | n protective coatings | |
| subject keywords | n titanium compounds | |
| subject keywords | n Al-TiN | |
| subject keywords | n CMOS-MEMS | |
| subject keywords | n FEM | |
| subject keywords | n Stoney formula | |
| subject keywords | n bi-layered structure | |
| subject keywords | n bilayered aluminum structure | |
| subject keywords | n comb-shaped structure | |
| subject keywords | n complementary metal oxide semiconductor | |
| subject keywords | n cross-shaped sensor | |
| subject keywords | n cross-shaped structure | |
| subject keywords | n finite element method | |
| subject keywords | n full-wafer coa | |
| identifier doi | 10.1109/EuroSimE.2014.6813834 | |
| journal title | ilitary Communications Conference (MILCOM), 2014 IEEE | |
| filesize | 460103 | |
| citations | 0 |


