Detection of faulty glucose measurements using texture analysis
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Year
: 2014DOI: 10.7873/DATE.2014.135
Keyword(s): binary decision diagrams,n single electron transistors,n IWLS 2005 benchmarks,n MCNC,n Moores law,n SET array,n single-electron transistor array synthesis,n ultra-low power consumption,n width minimization,n Arrays,n Benchmark testing,n Boolean functions,n Fabrics,n NIST,n Single electron transistors
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Detection of faulty glucose measurements using texture analysis
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| contributor author | Demitri, Nevine | |
| contributor author | Zoubir, Abdelhak M. | |
| date accessioned | 2020-03-12T21:40:16Z | |
| date available | 2020-03-12T21:40:16Z | |
| date issued | 2014 | |
| identifier other | 6952936.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1056437?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Detection of faulty glucose measurements using texture analysis | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8187476 | |
| subject keywords | binary decision diagrams | |
| subject keywords | n single electron transistors | |
| subject keywords | n IWLS 2005 benchmarks | |
| subject keywords | n MCNC | |
| subject keywords | n Moores law | |
| subject keywords | n SET array | |
| subject keywords | n single-electron transistor array synthesis | |
| subject keywords | n ultra-low power consumption | |
| subject keywords | n width minimization | |
| subject keywords | n Arrays | |
| subject keywords | n Benchmark testing | |
| subject keywords | n Boolean functions | |
| subject keywords | n Fabrics | |
| subject keywords | n NIST | |
| subject keywords | n Single electron transistors | |
| identifier doi | 10.7873/DATE.2014.135 | |
| journal title | ignal Processing Conference (EUSIPCO), 2014 Proceedings of the 22nd European | |
| filesize | 590592 | |
| citations | 0 |