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Identifying failure mechanisms in LDMOS transistors by analytical stability analysis

contributor authorFerrara, A.
contributor authorSteeneken, P.G.
contributor authorBoksteen, B.K.
contributor authorHeringa, A.
contributor authorScholten, A.J.
contributor authorSchmitz, J.
contributor authorHueting, R.J.E.
date accessioned2020-03-12T21:36:04Z
date available2020-03-12T21:36:04Z
date issued2014
identifier other6948825.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1054148?show=full
formatgeneral
languageEnglish
publisherIEEE
titleIdentifying failure mechanisms in LDMOS transistors by analytical stability analysis
typeConference Paper
contenttypeMetadata Only
identifier padid8184663
subject keywordsapplication program interfaces
subject keywordsn cryptography
subject keywordsn digital forensics
subject keywordsn digital signatures
subject keywordsn file organisation
subject keywordsn parallel algorithms
subject keywordsn probability
subject keywordsn OpenMP API
subject keywordsn SHA-1 algorithm
subject keywordsn collision probability
subject keywordsn data preservation
subject keywordsn digital forensics
subject keywordsn digital signature
subject keywordsn hash computation
subject keywordsn hashing algorithms
subject keywordsn information security
subject keywordsn parallel algorithm
subject keywordsn standard hash function
subject keywordsn Algorithm design and analysis
subject keywordsn Conferences
subject keywordsn Cryptography
subject keywordsn Multico
identifier doi10.1109/IAdCC.2014.6779437
journal titleolid State Device Research Conference (ESSDERC), 2014 44th European
filesize3104548
citations0


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