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The Wigner Monte Carlo method for accurate semiconductor device simulation

contributor authorEllinghaus, P.
contributor authorNedjalkov, M.
contributor authorSelberherr, S.
date accessioned2020-03-12T21:15:31Z
date available2020-03-12T21:15:31Z
date issued2014
identifier other6931576.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1042536?show=full
formatgeneral
languageEnglish
publisherIEEE
titleThe Wigner Monte Carlo method for accurate semiconductor device simulation
typeConference Paper
contenttypeMetadata Only
identifier padid8170253
subject keywordsArray signal processing
subject keywordsHandover
subject keywordsInterference
subject keywordsNiobium
subject keywordsSignal to noise ratio
subject keywordsThree-dimensional displays
subject keywordsThroughput
subject keywords3D beamforming
subject keywordsAAS
subject keywordshotspot
subject keywordsoffloading
subject keywordsvertical sectorization
identifier doi10.1109/ICCChina.2014.7008399
journal titleimulation of Semiconductor Processes and Devices (SISPAD), 2014 International Conference on
filesize285488
citations0


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