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Development of measuring apparatus for conducted disturbance voltage using TEM cell up to 1 GHz

Author:
Ishigami, S.
,
Gotoh, K.
,
Ifong Wu
,
Matsumoto, Y.
Publisher:
IEEE
Year
: 2014
DOI: 10.1109/CISP.2014.7003896
URI: https://libsearch.um.ac.ir:443/fum/handle/fum/1042003
Keyword(s): Algorithm design and analysis,Clustering algorithms,Eigenvalues and eigenfunctions,Equations,Mathematical model,Three-dimensional displays,Vectors,down sampling,feature point,normal angle,point cloud simplification
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    Development of measuring apparatus for conducted disturbance voltage using TEM cell up to 1 GHz

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contributor authorIshigami, S.
contributor authorGotoh, K.
contributor authorIfong Wu
contributor authorMatsumoto, Y.
date accessioned2020-03-12T21:14:39Z
date available2020-03-12T21:14:39Z
date issued2014
identifier other6931021.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1042003
formatgeneral
languageEnglish
publisherIEEE
titleDevelopment of measuring apparatus for conducted disturbance voltage using TEM cell up to 1 GHz
typeConference Paper
contenttypeMetadata Only
identifier padid8169576
subject keywordsAlgorithm design and analysis
subject keywordsClustering algorithms
subject keywordsEigenvalues and eigenfunctions
subject keywordsEquations
subject keywordsMathematical model
subject keywordsThree-dimensional displays
subject keywordsVectors
subject keywordsdown sampling
subject keywordsfeature point
subject keywordsnormal angle
subject keywordspoint cloud simplification
identifier doi10.1109/CISP.2014.7003896
journal titlelectromagnetic Compatibility (EMC Europe), 2014 International Symposium on
filesize1453595
citations0
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