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Defect study of Cu<inf>2</inf>ZnSn(S,Se)<inf>4</inf> thin film with different Cu/Sn ratio by admittance spectroscopy

contributor authorXianjia Luo
contributor authorIslam, M.M.
contributor authorHalim, M.A.
contributor authorXu, C.
contributor authorSakurai, T.
contributor authorSakai, N.
contributor authorKato, T.
contributor authorSugimoto, H.
contributor authorTampo, H.
contributor authorShibata, H.
contributor authorNiki, S.
contributor authorAkimoto, K.
date accessioned2020-03-12T21:06:59Z
date available2020-03-12T21:06:59Z
date issued2014
identifier other6925402.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1037510?show=full
formatgeneral
languageEnglish
publisherIEEE
titleDefect study of Cu<inf>2</inf>ZnSn(S,Se)<inf>4</inf> thin film with different Cu/Sn ratio by admittance spectroscopy
typeConference Paper
contenttypeMetadata Only
identifier padid8163841
subject keywordsbioelectric potentials
subject keywordsdiseases
subject keywordsedge detection
subject keywordslung
subject keywordsmedical signal detection
subject keywordsmedical signal processing
subject keywordspneumodynamics
subject keywordsboundary detection
subject keywordscontinuous respiratory sound detection
subject keywordsexpiratory phases
subject keywordsinspiratory phases
subject keywordsmanual phase-wise segmentation
subject keywordspulmonary emphysema
subject keywordsAcoustics
subject keywordsHidden Markov models
subject keywordsLungs
subject keywordsManuals
subject keywordsStandards
subject keywordsStethoscope
subject keywordsTraining
identifier doi10.1109/EMBC.2014.6943531
journal titlehotovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
filesize806762
citations0


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